TIEHI and TIELO Pull Cells
FA - Full Adder using 2 XNORs, 3 NANDs, and 1 INV
DFF - Rising Edge Triggered D Flip Flop
BSC - Boundary Scan Cell
BSR50 - 50-bit Boundary Scan Register
ADD16 - 16-bit Carry Select Adder
BSSUM - Combination of BSR50 and ADD16
256,684 Transistors using 45 nm Technology
Fault Coverage Optimization
Testing Power Efficiency
Low-Power (LP) BIST Architecture
Weighted Pseudorandom Test-Pattern Generation (TPG) and Reseeding
Scan Segmentation and Weighted Scan Chains
Partioned Deterministic Compressed Tests
Applications in Digital Microfluidic Logic Gates, Telecom SoC Silicon Validation, and Wearout Diagnosis
Please inquire for further details
Buck-Boost Converter
Low Dropout (LDO)
Reverse Polarity + ESD Protection
USB, GPIO, and RS-232 Peripherals
Hardware Signal Filtration
Transmission Lines with Bias Tee
Buck Converter
Low Dropout (LDO)
ESD Protection
MEMS Inertial Navigation Unit (IMU)
Pressure Sensor
Magnetometer
USB, GPIO, and RS-232 Peripherals
Hardware Signal Filtration
LED Power Indicators + Test Points (TPs)
Low Dropout (LDO)
ESD Protection
USB, GPIO, and RS-232 Peripherals
Hardware Signal Filtration
LED Power Indicators + Test Points (TPs)
Programmatically Parsed NMEA Data
Supported Feature not present in Existing API
Sourced Time and GNSS/INS data from GQ7 as Host
PPS Synchronization with Stratum Servers
Ultra-low Latency of 400 ns